At the Mobile World Congress (MWC) 2014, Agilent Technologies today released its latest X-Series measurement application.
The launch is aimed at extending its leadership in LTE-Advanced measurement business, Agilent said in a statement.
The software provides comprehensive RF conformance testing of LTE-Advanced FDD and TDD transmitters and components to the 3GPP Release 11 specification. It is available for both benchtop and modular products.
The LTE-Advanced options on the N9080B and N9082B for benchtop products and the M9080B and M9082B for modular products are priced at $4,500 each.
Agilent’s embedded LTE-Advanced X-Series measurement application is addressing the test challenge during the design validation and manufacturing phases. Earlier, Agilent’s previously introduced LTE-Advanced signal analyzer and signal generation solutions handled test related issues at the R&D stage.
The test and measurement vendor said the new LTE-Advanced measurement application provides one-button measurements for Agilent’s X-Series and modular signal analyzers. With fast measurement speed, SCPI programmability, pass/fail testing and simplicity of operation, the application is ideally suited for design verification and manufacturing.
Agilent’s LTE-Advanced measurement application enables the industry’s most comprehensive RF conformance testing of both contiguous and non-contiguous configurations of LTE-Advanced transmitters as defined by the 3GPP Release 11 specification. Specific measurements supported include transmitter characteristics testing of output power, transmitted signal quality, and unwanted emissions of both base stations and user equipment.
In addition, X-Series measurement applications increase the capability and functionality of the Agilent signal analyzer to speed time to insight. They provide essential measurements for specific tasks in general-purpose, cellular communications, wireless connectivity and digital video applications, covering more than 40 standards or modulation types.
