Test and measurement company Anritsu has added the Universal Fixture Extraction (UFX) option for its VectorStar vector network analyzers (VNAs).
Availability of signal integrity and more on-wafer and fixture calibration choices, even when a full set of calibration standards is not available are the main benefits.
Anritsu said UFX’s unique analysis tools will address the design challenges associated with the high-frequency, high data rate requirements of 4G and 5G systems, as well as backhaul and data centers, assisting engineers to accurately and efficiently evaluate designs.
VectorStar VNAs configured with UFX provide signal integrity and on-wafer engineers with multiple benefits. The VNA solution speeds time to market by enhancing model accuracy through improved test fixture de-embedding, thereby improving first time yields.
In environments where a complete set of calibration standards are not available, the traditional method is to assume that both paths of the fixture are perfectly symmetrical and with perfect match.
Using previous techniques result in substantial de-embedding errors. The UFX option provides advanced de-embedding tools, allowing engineers to incrementally add calibration standards and characteristic data as they become available, for improved fixture extraction accuracy.
Anritsu added a Sequential Peeling feature in UFX to aid in analyzing isolated defects within the test fixture. Signal integrity engineers can generate a .sNp file for a portion of a fixture based on phase function matching, granting an opportunity to easily improve the test fixture design.
UFX expands the capability of VectorStar to conduct on-wafer device characterization, as well as data transfer measurements. Anritsu said VectorStar utilizes NLTL technology to offer the broadest coverage, 70 kHz to 145 GHz, in a single instrument.
