Teradyne announced the availability of the MPAC (Magnum Precision Analog Channel) instrument for the Magnum family of test systems to enable massively parallel test of consumer digital semiconductor devices containing analog peripherals.
Teradyne has received orders from multiple customers for the MPAC instrument illustrating
the market’s strong demand for expanded analog test performance.
The automotive and consumer electronics markets continue to drive demand for integrated sensor and control functionality in semiconductor devices resulting in more analog content in microcontroller and other consumer digital SOCs,” said Tim Moriarty, general manager,
Teradyne’s Memory Business Unit.
The combination of MPAC’s analog test performance and high channel density design delivers market leading cost of test economics for these high volume device applications,” Moriarty added.
The MPACinstrument offers analog source and analog capture capability as well as a voltage reference for multiple test applications including embedded converters. For increased test system
configuration flexibility, the MPAC can be ordered with up to 48 channels of source/capture/Vref or with 24 channels of source/capture/Vref plus 32 device power supply channels.
Designed for massively parallel test applications, Magnum provides manufacturers of consumer digital devices an economic test solution for high-volume production. Magnum test systems range from 128 pins up to 5120 digital pins. The Magnum’s per-pin architecture is capable of testing a wide variety of flash memories and embedded logic devices making it an ideal solution for
the high-volume requirements of the consumer digital market.
By TelecomLead.com Team
editor@telecomlead.com
