Test and measurement (T&M) vendor Agilent Technologies today added Agilent EEs of EDA E4727A Advanced Low-Frequency Noise Analyzer, a hardware and software system for measurement and analysis of flicker noise and random telegraph noise (RTN).
Flicker noise significantly affects performance of circuits such as active mixers, voltage-controlled oscillators, frequency dividers, op amps and comparators, which are fundamental building blocks in RF, analog/mixed signal, and high-speed wireline communication applications.
Agilent Technologies said flicker noise and RTN are also both sensitive indicators of semiconductor material and manufacturing processes. With the semiconductor industry continuing to advance new technologies, the need for lower-frequency noise has never been greater.
Agilent’s Advanced Low-Frequency Noise Analyzer is designed from the ground up to meet these new challenges. Its modular design allows it to minimize system noise, provide measurement capabilities at an ultra-low frequency, and offer the best high-voltage/high-current handling capabilities on the market.
